DescriptionNova is looking for a highly accomplished
Research Scientist to join our technology organization and drive the exploration and development of advanced technologies for semiconductor materials characterization and metrology.
In this role, you will combine deep expertise in fundamental physics with hands-on experimental research to evaluate emerging technologies, develop advanced characterization concepts, and help shape the next generation of semiconductor metrology solutions.
The ideal candidate brings broad expertise across
X-ray technologies, electron-beam systems, materials science, surface characterization, detector technologies, and ultra-high-vacuum (UHV) physics, together with a strong understanding of the physical principles governing X-ray and particle interactions with materials.
Pay Range: 160,000 - 240,000 (DOE)
Role ResponsibilitiesWhat will you do as a Research Scientist?
- Drive advanced research in materials characterization, semiconductor metrology, and surface science, identifying emerging technologies with the potential to address future industry requirements.
- Develop innovative characterization and measurement concepts based on fundamental physics, modeling, simulation, and experimental validation.
- Define, design, and develop advanced experimental testbeds and proof-of-concept systems to evaluate the feasibility and performance of new technologies.
- Research and evaluate technologies related to X-ray sources and optics, detector systems, electron-beam sources and optics, high-voltage systems, and ultra-high-vacuum environments.
- Investigate the interaction of X-rays, electrons, ions, and other particles with materials and translate fundamental scientific understanding into practical metrology concepts.
- Evaluate emerging semiconductor materials and processes and identify associated materials characterization and non-destructive metrology challenges.
- Apply advanced analytical characterization techniques to investigate materials properties, surfaces, interfaces, and device structures.
- Assess the capabilities, limitations, and applicability of different analytical techniques and recommend the most appropriate characterization approaches.
- Anticipate future semiconductor metrology requirements and identify technology opportunities aligned with Nova's long-term technology roadmap.
- Collaborate with multidisciplinary teams across physics, engineering, algorithms, applications, and product development to transition promising research concepts toward practical solutions.
- Serve as a scientific and technical authority in relevant areas of expertise and contribute to knowledge sharing across the organization
Requirements- Ph.D. in Physics, Applied Physics, Materials Science, or a closely related scientific discipline.
- Extensive research experience in fundamental and applied physics relevant to advanced materials characterization and analytical instrumentation.
- Deep understanding of semiconductor technology, materials, processes, and metrology requirements.
- Strong expertise in one or more of the following areas:
- X-ray sources and X-ray generation technologies
- X-ray optics and instrumentation
- X-ray and particle interaction with matter
- Detector technologies
- Electron-beam sources and electron optics
- Ultra-high-vacuum systems and vacuum physics
- High-voltage systems and applications
- Significant hands-on experience designing, developing, and operating sophisticated experimental systems and research testbeds.
- Strong background in physics-based modeling, experimental design, data interpretation, and feasibility analysis.
- Experience with advanced vacuum technologies used in surface spectroscopy, microscopy, or related analytical instrumentation.
- Demonstrated ability to translate fundamental scientific principles into innovative technology concepts and experimental solutions.
That Special Something You Bring In:
- Broad expertise in analytical characterization techniques for materials analysis and surface science, including technologies such as:
- X-ray Photoelectron Spectroscopy (XPS)
- X-ray Fluorescence (XRF)
- Scanning Electron Microscopy / Energy Dispersive X-ray Spectroscopy (SEM/EDX)
- Transmission Electron Microscopy / EDX / Electron Energy Loss Spectroscopy (TEM/EDX/EELS)
- Secondary Ion Mass Spectrometry (SIMS)
- Strong understanding of the advantages, limitations, sensitivity, resolution, and appropriate applications of different analytical characterization techniques.
- Ability to independently identify complex scientific problems, formulate hypotheses, design experiments, and drive research from initial concept through feasibility demonstration.
- Curiosity and passion for emerging technologies and fundamental scientific research.
- Strong problem-solving and analytical skills with the ability to operate effectively in a multidisciplinary R&D environment.
- Excellent communication skills and the ability to communicate complex scientific concepts to both technical specialists and broader cross-functional teams.
