Job Summary:This position will take on metrology of thin crystalline material and perform analysis of the measurement to feedback growth/deposition process for material improvement, as well as device performance and yield improvement from the material, including defectivities. This position will work closely with processing and device teams of engineers.
Responsibilities:- X-ray characterization of crystalline thin film grown/deposition.
- Correlation of x-ray characterization over material quality and Electro-Opto device performance.
- Timingly feedback to growth/deposition with recommendation of improving material quality.
- Leading the development of novel metrologies into full SOP as needed for grown/depostion thin crystalline film.
- Familiarity with general metrology apparatus and know-how to work with vendors/suppliers.
Experience/Qualifications:- MS or PhD degree in material science or related disiplines.
- 5+ years of direct industry experience using x-ray characterization.
- 3+ year of industry experience in STEM/EDS, SEM, SIMS, AFM, SE, Raman, XPS
- Si technology related experience is a plus
We are not accepting unsolicited resumes from employment agencies.
The ranges below reflect the target ranges for a new hire base salary. One is for the Bay Area (within 50 miles of HQ, Palo Alto), the second one (if applicable) is for elsewhere in the US (beyond 50 miles of HQ, Palo Alto). If there is only one range, it is for the specific location of where the position will be located. Actual compensation may vary outside of these ranges and is dependent on various factors including but not limited to a candidate's qualifications including relevant education and training, competencies, experience, geographic location, and business needs. Base pay is only one part of the total compensation package. Full time roles are eligible for equity and benefits. Base pay is subject to change and may be modified in the future.
U.S. Base Pay Range
$170,000-$185,000 USD
Bay Area Pay Range
$204,000-$218,000 USD
